JPH0166061U - - Google Patents
Info
- Publication number
- JPH0166061U JPH0166061U JP1987161772U JP16177287U JPH0166061U JP H0166061 U JPH0166061 U JP H0166061U JP 1987161772 U JP1987161772 U JP 1987161772U JP 16177287 U JP16177287 U JP 16177287U JP H0166061 U JPH0166061 U JP H0166061U
- Authority
- JP
- Japan
- Prior art keywords
- component
- conveyance path
- television camera
- passage groove
- chip parts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000011179 visual inspection Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims 1
- 238000005286 illumination Methods 0.000 claims 1
- 230000007723 transport mechanism Effects 0.000 claims 1
- 238000007689 inspection Methods 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987161772U JPH065614Y2 (ja) | 1987-10-22 | 1987-10-22 | チップ部品自動外観検査機における部品搬送機構 |
KR1019890002517A KR0122739B1 (ko) | 1987-08-28 | 1989-02-28 | 칩-형 부품(chip-type components)을 분류하고 칩-형 부품의 외관을 광학적으로 점검하기 위한 방법과 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987161772U JPH065614Y2 (ja) | 1987-10-22 | 1987-10-22 | チップ部品自動外観検査機における部品搬送機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0166061U true JPH0166061U (en]) | 1989-04-27 |
JPH065614Y2 JPH065614Y2 (ja) | 1994-02-09 |
Family
ID=31445003
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987161772U Expired - Lifetime JPH065614Y2 (ja) | 1987-08-28 | 1987-10-22 | チップ部品自動外観検査機における部品搬送機構 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH065614Y2 (en]) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002341407A (ja) * | 2001-05-15 | 2002-11-27 | Shibuya Kogyo Co Ltd | 被検査物の撮影装置 |
CN113514755A (zh) * | 2021-06-11 | 2021-10-19 | 天津津航计算技术研究所 | 一种pcb板围框电性能自动检测装置及方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6046055U (ja) * | 1983-09-06 | 1985-04-01 | 村田精工株式会社 | パ−ツの上下面検査装置 |
JPS60261274A (ja) * | 1984-06-08 | 1985-12-24 | Seiei Kosan Kk | 集積回路等検査装置 |
-
1987
- 1987-10-22 JP JP1987161772U patent/JPH065614Y2/ja not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6046055U (ja) * | 1983-09-06 | 1985-04-01 | 村田精工株式会社 | パ−ツの上下面検査装置 |
JPS60261274A (ja) * | 1984-06-08 | 1985-12-24 | Seiei Kosan Kk | 集積回路等検査装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002341407A (ja) * | 2001-05-15 | 2002-11-27 | Shibuya Kogyo Co Ltd | 被検査物の撮影装置 |
CN113514755A (zh) * | 2021-06-11 | 2021-10-19 | 天津津航计算技术研究所 | 一种pcb板围框电性能自动检测装置及方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH065614Y2 (ja) | 1994-02-09 |
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